Integrated circuit and method for detecting a stress condition in the integrated circuit
US9910087B2 · kind B2 · utility
8Cited by
6References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 14, 2016 |
| Grant date | Mar 6, 2018 |
| Priority date | — |
| Expiry date | Apr 12, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/09
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An integrated circuit includes at least one first magnetic field sensing element including at least one first magnetoresistance element configured to provide an output signal of the integrated circuit in response to a detected magnetic field. The integrated circuit also includes at least one second magnetic field sensing element including at least one second magnetoresistance element configured to have a characteristic indicative of a stress condition. A method for detecting a stress condition in an integrated circuit is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.