Restoring ECC syndrome in non-volatile memory devices
US9910729B1 · kind B1 · utility
0Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 14, 2015 |
| Grant date | Mar 6, 2018 |
| Priority date | — |
| Expiry date | Dec 25, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of restoring an ECC syndrome in a non-volatile memory device having memory cells arranged in a plurality of sectors within a memory cell array, the method comprising identifying a first sector including at least one page having a disabled ECC (error correction code) flag; reading the value of all data bits in said at least one page; calculating values for ECC bits in said at least one page; and writing said data bit values and said calculated ECC bit values to a second sector in the memory cell array.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.