Methods and systems that categorize and summarize instrumentation-generated events
US9911143B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2014 |
| Grant date | Mar 6, 2018 |
| Priority date | — |
| Expiry date | Nov 16, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F40/30
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The current document is directed to methods and systems that receive instrumentation-generated events and that employ statistical inference to discover event topics and to assign a topic or category to each of a number of events. In a described implementation, the events comprise key/value pairs. A seeded local/global-topic latent Dirichlet allocation methods is used to discover topics and assign topics to a set of events. The topic-assigned events are then processed to generate topic signatures, using which the methods and systems assign topics to subsequently received messages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.