Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons
US9915626B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 26, 2015 |
| Grant date | Mar 13, 2018 |
| Priority date | — |
| Expiry date | Feb 26, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/05
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over a range of low-atomic-mass materials, and to detect and identify content of a volume of interest (VOI) exposed to cosmic-ray charged particles based on the constructed scattering and stopping relationship. In one aspect, a process for constructing a scattering-stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles is disclosed. This technique first determines a scattering parameter and a stopping parameter for each material within the range of low-density materials exposed to charged particles from cosmic ray. The technique then establishes a scattering-stopping relationship of cosmic ray charged particles for the range of low-density materials based on the determined pairs of scattering and stopping parameters associated with the range of low-density materials.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.