Systems and methods for averaging satellite sigmas and readmitting excluded satellite measurements into differential corrections and integrity monitors
US9915734B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 23, 2014 |
| Grant date | Mar 13, 2018 |
| Priority date | — |
| Expiry date | Oct 27, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S19/21
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods for averaging satellite sigmas and readmitting excluded satellite measurements into differential corrections and integrity monitors are provided. In one embodiment, a method comprises: calculating a first RFI based averaged sigma and a second RFI based averaged sigma, wherein the first RFI based averaged sigma includes a sigma for the excluded satellite measurement and wherein the second RFI based averaged sigma does not include the sigma for the excluded satellite measurement; and, readmitting the excluded satellite measurement into either a differential correction broadcast or a respective integrity monitor when the first RFI based averaged sigma is less than or equal to the second RFI based averaged sigma.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.