White box testing
US9916230B1 · kind B1 · utility
2Cited by
8References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 15, 2017 |
| Grant date | Mar 13, 2018 |
| Priority date | — |
| Expiry date | Aug 15, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The source code of a software artifact may be scanned, and a call tree model with leaf nodes may be generated based on the scan. A set of test cases can be executed against the software artifact and log data from the execution can be collected. A set of untested leaf nodes can be detected and a new set of test cases can be generated to test the untested nodes. The new set of test cases are executed and a subset of the test cases which cover the previously untested nodes are added to the existing set of test cases.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.