Evaluating images
US9916488B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 3, 2017 |
| Grant date | Mar 13, 2018 |
| Priority date | — |
| Expiry date | May 3, 2037 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K19/06028
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for evaluating an output pattern printed on a medium is described. A reference pattern is stored. The output pattern is printed on the medium based correspondingly on the stored reference pattern. A scan based instance of the output pattern is rendered, which has a set of features at least corresponding to the printed output pattern and zero or more features additional thereto. A difference image, having the zero or more features of the rendered scan instance, is computed based on a comparison of the rendered scan instance to the stored reference pattern. Upon the zero or more features including at least one feature, the computed difference image is evaluated in relation to a proximity of at least one feature to locations pixels of the reference pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.