Structured light active localization microscopy
US9921161B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jan 8, 2016 |
| Grant date | Mar 20, 2018 |
| Priority date | — |
| Expiry date | Apr 13, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B27/58
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and systems are provided for estimating locations of sub-wavelength-sized emitters, which may be sparsely arrayed among inactive emitters, in one or more dimensions to synthesize a super-resolved image. The emitter emits light in response to structured illumination, which may be acousto-optically generated. The structured illumination is translated, and a detector, such as a camera pixel, senses the emitted linear or nonlinear response, producing a periodic signal. A processor computes a phase of the signal using phase shifting interferometry and uses it to estimate the emitter location with resolution finer than a quarter of the illumination wavelength. Modulation depth and/or amplitude of the signal may be used to estimate emitter size and/or evaluate location fidelity. Optical sectioning or extended depth of field may be provided by controlling spatial coherence of the illumination. Encoding and decoding emitter locations with non-periodic patterns is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.