System and method for testing frequency synthesizer
US9921296B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 11, 2013 |
| Grant date | Mar 20, 2018 |
| Priority date | — |
| Expiry date | Dec 30, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S7/4065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing a frequency synthesizer over a predetermined frequency range using a delay unit complying with a spectral delay distribution model modeling a spectral delay distribution of the delay unit over the predetermined frequency range. The method comprises generating at least one test signal with the frequency synthesizer according to at least one test command; passing the at least one test signal through the delay unit so as to obtain at least one delayed test signal; measuring at least one shift of a signal attribute between the delayed test signal and the test signal; estimating an accuracy of the frequency synthesizer by comparing the at least one measured shift with an expected shift, the expected shift being derived from the spectral delay distribution model of the delay unit and from the at least one test command.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.