Detection of defects in touch sensors
US9921683B2 · kind B2 · utility
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3References
19Claims
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Assignee
Inventors
Key dates
| Filing date | May 30, 2012 |
| Grant date | Mar 20, 2018 |
| Priority date | — |
| Expiry date | Nov 24, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/52
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Defects in a touch sensor are detected by coupling the sensor lines to a common signal line. Each of the sensor lines is tested by disconnecting the sensor line from the common signal line, connecting it to a voltage (e.g., ground) and comparing the voltage on the common signal line to a reference voltage. Detected defects include a short circuit between any two transmit and/or receive lines and a short between any transmit or receive line to ground.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.