Patent · US Active

Wafer-scale testing of photonic integrated circuits using horizontal spot-size converters

US9922887B2 · kind B2 · utility

26Cited by
3References
20Claims
0Family size

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Key dates

Filing dateDec 11, 2013
Grant dateMar 20, 2018
Priority date—
Expiry dateDec 11, 2033

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B2006/12195
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

Disclosed herein are methods, structures, and devices for wafer scale testing of photonic integrated circuits.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.