Resonance inspection sorting module array
US9927403B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 28, 2015 |
| Grant date | Mar 27, 2018 |
| Priority date | — |
| Expiry date | Jul 7, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N29/4427
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A resonance inspection tool is disclosed that may be configured to assign a part to a first classification (accepted part) or a second classification (rejected part) using a cluster combination array. Such a cluster combination array may be defined from a first cluster array having a plurality of first clusters (each being of the first classification), and from a second cluster array having a plurality of second clusters (each being of the second classification). One cluster combination array presents all possible combinations of the same first cluster from the first cluster array and each second cluster from the second cluster array, where each such cluster combination includes a corresponding sort. Another cluster combination array presents all possible combinations of the same second cluster from the second cluster array and each first cluster from the first cluster array, where each such cluster combination includes a corresponding sort.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.