Enhanced AWG waveform calibration using S-parameters
US9927485B2 · kind B2 · utility
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6Claims
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Key dates
| Filing date | Sep 23, 2011 |
| Grant date | Mar 27, 2018 |
| Priority date | — |
| Expiry date | Oct 11, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2841
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the present invention provide enhanced methods of calibrating arbitrary waveform generators using s-parameters, and arbitrary waveform generators calibrated according to those methods. Methods are provided for calibrating a single, non-interleaved channel of an arbitrary waveform generator, calibrating multiple interleaved channels, and calibrating pairs of channels, both interleaved and non-interleaved, to generate differential signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.