Method for characterizing a sample by measurement of a backscattered optical signal
US9931072B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 4, 2016 |
| Grant date | Apr 3, 2018 |
| Priority date | — |
| Expiry date | Feb 4, 2036 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2503/40
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Determining an optical property of a sample having an illumination of a surface of the sample with the aid of a light beam, so as to form, on the surface of the said sample, an elementary illumination zone, corresponding to the part of the said surface illuminated by the said sample. A detection of N optical signals, backscattered by the sample, each optical signal emanating from the surface of the sample at a distance, termed the backscattering distance, from the said elementary illumination zone, N being an integer greater than or equal to 1, so as to form as many detected signals. A determination of at least one optical property of the sample, by comparison between: a function of each signal thus detected and a plurality of estimations of the said function each estimation being carried out by considering a predetermined value of the said optical property, characterized in that during the said detection step, at least one backscattering distance is less than 200 pm.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.