Device for testing electronic components

US9933457B2 · kind B2 · utility

Assignee

• Multitest Elektronische Systeme GmbH · DE

Inventors

• Volker Leikermoser · Aschau, DE
• Gerhard Gschwendtberger · Brannenburg, DE

Key dates

• Filing date: Mar 10, 2015
• Grant date: Apr 3, 2018
• Expiry date: Dec 25, 2035

Classification

• Technology area (CPC B): Performing Operations; Transporting
• CPC primary: B08B1/12
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Embodiments of the invention is based on a device for testing electronic components with at least one test socket with test contacts, with a nest, in which at least one electronic component can be placed, and with at least one cleaning unit for the test contacts of the test socket, wherein by means of a relative movement, which can be carried out as a test stroke, between the test socket and nest the electronic component can be pressed against, and lifted from, the test contacts of the test socket. According to embodiments of the invention the at least one cleaning unit is designed in such a manner that during each test stroke the test contacts come into contact with the at least one cleaning unit.