Patent · US Active

Probe card and method for performing an unclamped inductive switching test using multiple equal-length interconnection lines emanating from a common connection node

US9933476B2 · kind B2 · utility

0Cited by

4References

11Claims

0Family size

Assignee

Infineon Technologies Austria AG · AT

Inventors

Michael Leutschacher · Finkenstein, AT
Norbert Rieser · Millstatt, AT

Key dates

Filing date	Aug 4, 2015
Grant date	Apr 3, 2018
Priority date	—
Expiry date	Oct 23, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2601
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A probe card with a ground contact, a first contact element and a second contact element is provided. The first contact element is coupled to an interconnection node via a first interconnection line having a definite length and the second contact element is coupled to the interconnection node via a second interconnection line having the same definite length. The interconnection node is directly connected to the ground contact.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.