Patent · US Active

Method of forming fine patterns

US9934986B2 · kind B2 · utility

0Cited by
9References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 2016
Grant dateApr 3, 2018
Priority date
Expiry dateFeb 22, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/32139
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Provided is a method of forming fine patterns, which is capable of easily forming a plurality of patterns repeatedly with a fine pitch when forming patterns necessary for manufacturing a highly integrated semiconductor device exceeding a resolution limit of a photolithography process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.