Patent · US Active

Enabling secured debug of an integrated circuit

US9939074B2 · kind B2 · utility

1Cited by
1References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 6, 2014
Grant dateApr 10, 2018
Priority date
Expiry dateJan 26, 2035

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB01J2208/00787
  • WIPO fieldMechanical elements
  • WIPO sectorMechanical engineering

Abstract

Secured debug of an integrated circuit having a test operation mode and a secure mission operation mode. The integrated circuit has a processing unit, a test interface through which the test operation mode is controllable, an on-chip memory which is accessible in the test operation mode and in the secure mission operation mode, and one or more protected resources inaccessible in the test operation mode. The processing unit is configured, in the test operation mode, to receive an authenticated object through the test interface, and store the received authenticated object in the on-chip memory. The processing unit is moreover configured, upon reset into the secure mission operation mode, to execute a boot procedure to determine that the authenticated object is available in the on-chip memory, authenticate the authenticated object, and—upon successful authentication—render the more protected resources accessible to a debug host external to the integrated circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.