Inspection method using a film overlay
US9939391B1 · kind B1 · utility
2Cited by
6References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 15, 2016 |
| Grant date | Apr 10, 2018 |
| Priority date | — |
| Expiry date | Dec 20, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2694
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of inspecting a component using a film overlay including providing the component, the component having a first surface, a core, and a second surface; positioning a film overlay having a reference indicia and a structural indicia on the first surface of the component; aligning the reference indicia on the film overlay with a reference feature on the component; positioning a testing probe on a top surface of the film overlay so the probe is aligned with the structural indicia; and transmitting a signal from the probe through the film overlay, the first surface, the core, and the second surface.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.