Capacitance measurement

US9939476B2 · kind B2 · utility

Assignee

• Analog Devices Global Unlimited Company · BM

Inventors

• Christian Steffen Birk · Ulm, DE
• John A. Cleary · Kilmallock, IE
• David Sayago Montilla · Limerick, IE
• Elizabeth A. Lillis · Limerick, IE
• Padraig O'Connor · Aherla, IE
• Eoin E. English · Pallasgreen, IE
• Patrick Pratt · Mallow, IE
• Kathleen Embrechts · Lo-Reninge, BE
• Wim Rens · Schriek, BE
• Jan Crols · Oud-Heverlee, BE

Key dates

• Filing date: Sep 25, 2015
• Grant date: Apr 10, 2018
• Expiry date: Mar 13, 2036

Classification

• Technology area (CPC B): Performing Operations; Transporting
• CPC primary: B81B2201/0235
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Embodiments of the present invention may provide a method of measuring an unknown capacitance of a device. The method may comprise the steps of driving a test signal to a circuit system that includes a current divider formed by the device with unknown capacitance and a reference capacitor; mirroring a current developed in the reference capacitor to a second circuit system that includes a measurement impedance; measuring a voltage within the second circuit system; and deriving a capacitance of the unknown capacitance based on the measured voltage with reference to a capacitance of the reference capacitor and the measurement impedance.