Measurement of focal points and other features in optical systems
US9945756B2 · kind B2 · utility
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2References
5Claims
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Key dates
| Filing date | Feb 18, 2014 |
| Grant date | Apr 17, 2018 |
| Priority date | — |
| Expiry date | Nov 4, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/0064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Identifying a location of a focal point of an optical system includes, in some implementations, using a sensor system to detect light that passed through the optical system, and determining a location of a focal point of the optical system based on a location of a focal point of the sensor system that substantially matches the location of the focal point of the optical system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.