Patent · US Active

Method and device for measuring internal quantum efficiency of an optical element

US9945898B2 · kind B2 · utility

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1References
8Claims
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Key dates

Filing dateJul 31, 2013
Grant dateApr 17, 2018
Priority date
Expiry dateDec 27, 2034

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/062
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for measuring the efficiency of an optical element is disclosed. The intensity of the light emitted from the optical element is measured by applying an injection current to the optical element, a relative radiative efficiency is calculated from a ratio of the intensity of the emitted light to the injection current, the maximum relative radiative efficiency and the maximum injection current corresponding to the maximum relative radiative efficiency are obtained, a reference injection current for minimizing an amount of change of a recombination coefficient in an active layer of the optical element in correspondence with a carrier density change in the active layer of the optical element is extracted from data of injection currents that are equal to or less than the maximum injection current and data of relative radiative efficiencies that are equal to or less than the maximum relative radiative efficiency, a reference internal quantum efficiency of the optical element is calculated from the reference injection current, and internal quantum efficiencies of the optical element in various injection currents are calculated from the reference internal quantum efficiency.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.