Measuring and correcting non-idealities of a system
US9945901B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 18, 2016 |
| Grant date | Apr 17, 2018 |
| Priority date | — |
| Expiry date | Oct 18, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Many systems implement calibration schemes to measure and correct for the non-idealities. Such systems can be complex, which makes them impractical to implement since the cost can potentially outweigh the benefits of the calibration scheme. To implement efficient and effective calibration, non-idealities or errors of a system are detected, in foreground or in background, in a piecewise fashion based on, e.g., correlations of an output signal with an uncorrelated random signal, where the correlation results are processed separately for different open intervals of an error signal. Second order and third order correction terms can be easily determined based on three open intervals. In various embodiments, the calibration scheme can detect and correct for linear errors, (linear and non-linear) memory/frequency dependent errors, static nonlinearity errors, Hammerstein-style non-linearity errors, and Wiener-style non-linearity errors (cross-terms).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.