Computing device service life management
US9946981B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 1, 2015 |
| Grant date | Apr 17, 2018 |
| Priority date | — |
| Expiry date | Feb 10, 2036 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/065
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A method and information handling system for obtaining information handling system wear parameter values representative of wear of the information handling system, the information handling system wear parameter sensors comprising a motherboard event wear parameter sensor for obtaining motherboard event wear parameter values, a component event wear parameter sensor for obtaining component event wear parameter values, and a usage wear parameter sensor for obtaining usage wear parameter values, for calculating client information handling system wear based on the information handling system wear parameter values and the statistical model of wear estimation, and for providing a service life indication for the client information handling system, the service life indication indicative of a disposition suitability.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.