Reflectivity map estimate from dot based structured light systems
US9947099B2 · kind B2 · utility
14Cited by
8References
20Claims
0Family size
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Key dates
| Filing date | Jul 27, 2016 |
| Grant date | Apr 17, 2018 |
| Priority date | — |
| Expiry date | Sep 20, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2215/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Systems and methods are provided for determining a depth map and a reflectivity map from a structured light image. The depth map can be determined by capturing the structured light image and then using a triangulation method to determine a depth map based on the dots in the captured structured light image. The reflectivity map can be determined based on the depth map and based on performing additional analysis of the dots in the captured structured light image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.