Non-interferometric phase measurement
US9947118B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 27, 2015 |
| Grant date | Apr 17, 2018 |
| Priority date | — |
| Expiry date | Jun 3, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Techniques described herein are generally related to non-interferometric phase measurements of an optical signal. The various described techniques may be applied to methods, systems, devices or combinations thereof. Some methods for determining phase data of the optical signal may include transmitting the optical signal through a first optical element and obtaining first intensity data at a first focal plane of the first optical element by an optical sensor. Example methods may also include transmitting the optical signal through a second optical element. The second optical element may include a phase transformation mask. Example methods may further include obtaining a second intensity data at a second focal plane of the second optical element by the optical sensor and determining the phase data for the optical signal based on the first intensity data and the second intensity data.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.