Camera subassembly dust and defect detection system and method
US9948842B2 · kind B2 · utility
1Cited by
11References
11Claims
0Family size
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Key dates
| Filing date | Jun 26, 2015 |
| Grant date | Apr 17, 2018 |
| Priority date | — |
| Expiry date | Mar 21, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A high resolution image of a CCD camera subassembly is examined to determine whether dust is present inside the subassembly. By examining the size, number, and location of the dust particles it can be determined whether the dust is likely to cause issues when the camera subassembly is integrated into a fully assembled document scanner. Other contaminants and defects, such as scratches on the glass covering, can also be detected. This method can be used as the acceptance criteria of individual camera subassemblies from the manufacturer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.