Analysis of effect of transient events on temperature in a data center
US9952103B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 22, 2011 |
| Grant date | Apr 24, 2018 |
| Priority date | — |
| Expiry date | Aug 13, 2033 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2119/08
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer-implemented method for evaluating cooling performance of equipment in a data center. In one aspect, the method comprises receiving data related to equipment in the data center, determining first parameters related to airflow and temperature in the data center at a first period in time, receiving a description of a transient event affecting one of airflow and temperature in the data center at a second time, breaking a second time period subsequent to the second time into a plurality of time intervals, determining second parameters related to airflow in the data center during one of the time intervals, determining the parameters related to temperature in the data center at each of the time intervals based on the second parameters related to airflow, and storing, on a storage device, a representation of the parameters related to temperature in the data center during the second time period.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.