Path length calibration system and method
US9952139B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 12, 2016 |
| Grant date | Apr 24, 2018 |
| Priority date | — |
| Expiry date | Nov 4, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus includes a first pedestal surface coupled to i) a swing arm and to ii) a light source. The apparatus further includes a magnet, a base plate, a mechanical stop coupled to the base plate, and a second pedestal surface mechanically coupled to said base plate and configured to receive a liquid sample, said second pedestal surface being coupled to a spectrometer. The apparatus further includes a magnetic flux sensor located between north and south magnetic flux fields of the magnet such that the magnetic flux reaching the sensor while the mechanical stop is in physical contact with the swing arm provides a linear range of output of the magnetic flux sensor, and a processor adapted to calibrate the point for minimum optical path length using a threshold magnetic flux field emitted from the magnet and detected by the magnetic flux sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.