Method and device for process monitoring
US9952236B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 11, 2012 |
| Grant date | Apr 24, 2018 |
| Priority date | — |
| Expiry date | Mar 13, 2035 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P10/25
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a method for monitoring a generative fabrication process in which a component is formed in an installation space from a multiplicity of layers by using a three-dimensional data model and a following layer is fixed to a preceding layer by means of a high-energy beam. The method comprises detecting the component at least optically and detecting the installation space thermally during layer application. Also disclosed is a device for carrying out the method.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.