Method and device for reducing extrinsic dark count of nanowire single photon detector comprising a multi-layer film filter

US9954158B2 · kind B2 · utility

Assignee

• SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY CHINESE ACADEMY OF SCIENCES · CN

Inventors

• Lixing You · Shanghai, CN
• Hao Li · Nanhu, CN
• Xiaoyan Yang · Beijing, CN
• Weijun Zhang · Nanhu, CN
• Zhen Wang · Shanghai, CN

Key dates

• Filing date: May 12, 2014
• Grant date: Apr 24, 2018
• Expiry date: Jun 9, 2034

Classification

• Technology area (CPC H): Electricity
• CPC primary: H10N60/84
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and a device for reducing the extrinsic dark count of a superconducting nanowire single photon detector (SNSPD), it comprises the steps of: integrating a multi-layer film filter on the superconducting nanowire single photon detector; the multi-layer film filter is a device implemented by a multi-layer dielectric film and having a band-pass filtering function. The extrinsic dark count is the dark count triggered by optical fiber blackbody radiance and external stray light. The superconducting nanowire single photon detector comprises: a substrate having an upper surface integrated with an upper anti-reflection layer and a lower surface integrated with a lower anti-reflection layer; an optical cavity structure; a superconducting nanowire; and a reflector. The present invention is easy to operate, and only needs to integrate the multi-layer film filter on the substrate of the SNSPD to filter non-signal radiation.