Measuring parameters of a cut gemstone
US9958398B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 2014 |
| Grant date | May 1, 2018 |
| Priority date | — |
| Expiry date | Oct 8, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/08
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and corresponding methods for measuring a plurality of parameters of a cut gemstone while it is positioned at a single measurement location. Apparatus comprise a plurality of light sources, each configured to emit light at a different one of a plurality of emission wavelengths or ranges of wavelengths such that the emitted light illuminates at least part of the measurement location. Apparatus further comprise a sensor assembly configured to sense light at a plurality of sensing wavelengths or ranges of wavelengths for measuring the plurality of parameters. The sensed light is received at the sensor assembly from the measurement location as a result of illumination of a cut gemstone located at the measurement location.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.