Data processing device and method of conducting a logic test in a data processing device
US9959172B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 25, 2013 |
| Grant date | May 1, 2018 |
| Priority date | — |
| Expiry date | Mar 27, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2284
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A data processing device, comprising a processing unit and a test control unit connected to the processing unit, is described. The processing unit and the test control unit are arranged to: start a logic test of the processing unit; detect a test abort event; and, in response to the test abort event, perform an event response action which comprises aborting the logic test and booting the processing unit, said booting including executing an event handling routine. The event response action may comprise setting a reset vector to an address of the event handling routine. System availability may thus be improved. In particular, the delay between capturing an asynchronous signal and responding to it may be reduced. The test abort event may, for example, be an asynchronous event having certain pre-defined characteristics.A method of operating a data processing device is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.