Patent · US Active

Particle manipulation system with out-of-plane channel and variable cross section focusing element

US9962702B2 · kind B2 · utility

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22Claims
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Key dates

Filing dateJun 29, 2017
Grant dateMay 8, 2018
Priority date
Expiry dateJun 29, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/06113
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A particle manipulation system uses a MEMS-based, microfabricated particle manipulation device which has a sample inlet channel, output channels, and a movable member formed on a substrate. The device may be used to separate a target particle from non-target material in a sample stream. In order to improve the sorter speed, accuracy or yield, the particle manipulation system may also include a microfluidic structure which focuses the target particles in a particular portion of the sample inlet channel. This focusing element may include cavities of variable cross section along the channel length. In addition, a filtering element may also be included upstream of the focusing element.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.