Quality control method for optometric measurements
US9974435B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 17, 2014 |
| Grant date | May 22, 2018 |
| Priority date | — |
| Expiry date | Dec 7, 2034 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG16H10/60
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A quality control method for optometric measurements includes the following steps: (a) recording, via computer, a first record (14) that includes at least one first value of a first identifier (12), enabling identification of a glasses wearer (1), and at least one other value of another identifier (13) enabling identification of an optometric apparatus (15) on a first optometric measuring site (10); (b) carrying out at least one optometric measurement (16) of the wearer; (c) sending, to a second site (20), a digital measurement data set (18) including the optometric measurement result from step (b), the digital data set being linked, via computer, to the first record; and (d) digitally processing the optometric measurement result from the first record (14) on the basis of a digital data reference system (45) and the values of the respective identifiers of the glasses wearer and the optometric apparatus of the first record.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.