Patent · US Active

Lithography apparatus, and method of manufacturing article

US9977346B2 · kind B2 · utility

2Cited by
4References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 9, 2017
Grant dateMay 22, 2018
Priority date
Expiry dateFeb 9, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG03F7/709
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

The present invention provides a lithography apparatus which performs a process of forming a pattern on a substrate, the apparatus comprising a processing device configured to perform the process, an actuator configured to exert an action to the processing device, a detector configured to detect vibrations of a support for supporting the processing device, and a controller configured to control the actuator, wherein the controller is configured to perform an estimation of vibration transferred from the processing device to the detector, and control the actuator based on vibration obtained by the estimation and vibration detected by the detector.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.