Overheat detection circuit and semiconductor device
US9983068B2 · kind B2 · utility
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24References
4Claims
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Assignee
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Key dates
| Filing date | Dec 15, 2015 |
| Grant date | May 29, 2018 |
| Priority date | — |
| Expiry date | Oct 12, 2036 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K3/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided is an overheat detection circuit that is capable of quickly outputting an overheated state detection signal in an overheated state without outputting an unintended erroneous output caused by disturbance noise, such as momentary voltage fluctuations in the power supply. The overheat detection circuit includes: a temperature sensor; a comparison section; and a disturbance noise removal section configured to output an overheated state detection signal to an output section after a predetermined delay time has elapsed. The delay time is reduced in proportion to temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.