Patent · US Active

Self-aligning probes and related devices

US9983107B2 · kind B2 · utility

0Cited by

12References

10Claims

0Family size

Assignee

The Regents of the University of California · US

Inventors

Paul K. Hansma · Isla Vista, US
Connor Randall · Salida, US
Daniel Bridges · Goleta, US

Key dates

Filing date	Jul 22, 2013
Grant date	May 29, 2018
Priority date	—
Expiry date	Sep 3, 2033

Classification

Technology area (CPC G)Physics
CPC primaryG01N3/42
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The field of the invention generally relates to probes, related devices and methods for measuring material properties. In an embodiment, the present invention provides a test probe for use in a reference point indentation device. The test probe has an end proximal to a tip and an end distal to the tip. The distal end of the test probe has a self-centering mate comprising a countersink of about 90 degrees to about 100 degrees to a depth of between 0.010 in. and 0.035 in.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.