Automated value analysis in legacy data
US9984173B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 2014 |
| Grant date | May 29, 2018 |
| Priority date | — |
| Expiry date | Jan 31, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F16/972
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system, and computer program product for automated value analysis in legacy data are provided in the illustrative embodiments. A first number of occurrences of a first value in a first field is counted in the legacy data. A first identifier associated with the first field, the first value, and the first count are recorded as a first entry in a value data structure, the value data structure comprising a set of entries. The value data structure is analyzed to determine an aberration between the first count and a second count, wherein the second count corresponds to a second number of occurrences of a second value in the first field. The aberration at the first field of the legacy data is reported in a report.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.