Patent · US Active

Microscopy support structures

US9984850B2 · kind B2 · utility

0Cited by
26References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 23, 2016
Grant dateMay 29, 2018
Priority date
Expiry dateFeb 23, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/2802
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.