Patent · US Active

Measurement probe and optical measurement system

US9986891B2 · kind B2 · utility

0Cited by
1References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 15, 2016
Grant dateJun 5, 2018
Priority date
Expiry dateJan 27, 2037

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2201/08
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measurement probe includes: a plurality of optical fibers including an illumination fiber configured to propagate light to irradiate a measuring object and including a light receiving fiber configured to receive scattered light retuned from the measuring object; and a detection portion configured to detect contact with the measuring object, the detection portion having a contact part provided on a part of a side portion of the measurement probe, the side portion forming a surface along a longitudinal direction of the measurement probe, the contact part being configured to be in contact with measuring object.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.