System, apparatus, and method for monitored thermal spraying

US9988703B2 · kind B2 · utility

Inventors

• David J. Cook · Farmington Hills, US
• Keith A. Kowalsky · East Norwich, US
• Chris Berghorn · East Moriches, US
• John Conti · Brighton, US
• Scott R. Harrigan · Oyster Bay, US
• David G. Barton · Madison, US

Key dates

• Filing date: Jun 23, 2016
• Grant date: Jun 5, 2018
• Expiry date: Jun 23, 2036

Classification

• Technology area (CPC C): Chemistry; Metallurgy
• CPC primary: C23C4/131
• WIPO field: Surface technology, coating
• WIPO sector: Chemistry

Abstract

A system (100), apparatus (110), and method (900) for monitored thermal spraying. One or more sensors (610) are used to capture one or more types of measurements (650) to monitor the thermal spraying process. A processor (710) can analyze a waveform (750) of measurements (650), such as electrical measurements (652). The processor (710) can then initiate a response (770) such as a warning (772) or an automatic adjustment (790) that is triggered by an identified operating condition (800).