Patent · US Active

Temperature measurement arrangement

US9989417B2 · kind B2 · utility

0Cited by
14References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 11, 2014
Grant dateJun 5, 2018
Priority date
Expiry dateSep 11, 2034

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02B40/00
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is a system for dielectrically processing a product in a radio frequency (RF) cavity. The system may include a cavity; an RF feeding module that includes a plurality of radiating elements configured to feed RF radiation into the cavity, and a plurality of dummy loads for receiving RF energy coupled from the cavity into the radiating elements; and the system includes a processor configured to (a) estimate an effect operating the system at each of a plurality of sets of operating parameters will have on the temperature of each of the dummy loads; (b) choosing among the plurality of sets of operating parameters at least one set based on the estimation; and (c) controlling the system to operate at the chosen at least one set of operating parameters.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.