Patent · US Active

SAFT analysis of defects close to the surface

US9989500B2 · kind B2 · utility

1Cited by

11References

20Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventor

Hubert Mooshofer · Birkenfeld, DE

Key dates

Filing date	Jan 16, 2014
Grant date	Jun 5, 2018
Priority date	—
Expiry date	Nov 2, 2034

Classification

Technology area (CPC G)Physics
CPC primaryG01N2291/044
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and device for the ultrasonic testing of test objects by means of a test head. A computer device directly acquires, during a SAFT analysis for determining points in time of the amplitudes to be summed up from among the image time signals, a propagation time, which depends on the test head, from the test head positioned at a measuring point to the location of each of a plurality of voxels and uses the propagation time for calculating an amplitude total for the plurality of voxels.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.