Patent · US Active

Smart testing management

US9991977B2 · kind B2 · utility

0Cited by
1References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 20, 2016
Grant dateJun 5, 2018
Priority date
Expiry dateMay 20, 2036

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH04B17/318
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

The invention is related to a smart testing apparatus and preferably a method for testing at least a first DUT and a second DUT using a mobile communications testing device. The method comprises the steps of determining, whether a first RF test signal from/to the first DUT interferes with a second RF test signal from/to the second DUT. It determines, whether the second RF test signal from/to second DUT interferes with the first RF test signal from/to the first DUT. It predetermines, whether at least measuring the first measuring result obtained by applying the first RF test signal is disturbed above a first disturbance threshold value. It predetermines, whether at least a second measuring result obtained by applying the second RF test signal is disturbed above a second disturbance threshold value.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.