Method and device for the preparation and optical analysis of a solid sample subjected to a controlled environment, by multiple internal reflection infrared spectroscopy
US9995676B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 23, 2014 |
| Grant date | Jun 12, 2018 |
| Priority date | — |
| Expiry date | Mar 23, 2035 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N1/2813
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of preparation and optical analysis of a solid sample by multiple internal reflection infrared spectroscopy comprising: obtaining a least one substrate that is transparent to infrared light and comprises at least a main front face and a main rear face; producing at least one solid sample on the main front face of the substrate; installing around at least one part of the sample an element comprising a chamber having an aperture that opens onto the solid sample and defines a leaktight interaction zone (Zi) in relation to the outside of the chamber; feeding the chamber with a fluid with controlled parameters to control the environment in the leaktight interaction zone; sending an infrared light beam through the substrate; and recovering the beam after it has undergone multiple internal reflections in the substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.