Image sensor failure detection
US9998700B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 5, 2016 |
| Grant date | Jun 12, 2018 |
| Priority date | — |
| Expiry date | Jan 11, 2037 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/78
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A novel image sensor includes error detection circuitry for detecting sequencing errors. In a particular embodiment a pattern is inserted into a captured image and an image processor detects sequencing errors by determining a location of the pattern. In a more particular embodiment, the image sensor includes a pixel array, arranged in columns and rows. A row select signal is encoded as a bitwise signal, and the bitwise signal is decoded by a multi-input AND gate associated with a particular column of the image sensor, based on a relationship between rows and columns of the pixel array. The relationship determines the pattern asserted into the captured image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.