Patent · US Expired

Integrated circuit tester

USD308645S · kind S · design

6Cited by
10References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 26, 1987
Grant dateJun 19, 1990
Priority date
Expiry dateJun 19, 2004

Classification

  • Technology area (CPC —)General

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.