Patent · US Expired

Test device

USD481800S1 · kind S1 · design

6Cited by
59References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 19, 2003
Grant dateNov 4, 2003
Priority date
Expiry dateNov 4, 2017

Classification

  • Technology area (CPC —)General

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.