Patent · US Expired

Testing device

USD497673S1 · kind S1 · design

23Cited by
9References
1Claims
0Family size

Assignee

Inventor

Key dates

Filing dateFeb 24, 2003
Grant dateOct 26, 2004
Priority date
Expiry dateOct 26, 2018

Classification

  • Technology area (CPC —)General

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.